Quick Vision® WLI supports both vision measurement and high accuracy 3D measurement in one machine (Aurora, IL) Mitutoyo America Corporation announces release of the new Quick Vision® WLI vision measuring machine.
Besides an optical vision head, the Quick Vision® WLI also incorporates a white light interferometer (WLI) head.
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Instead of static pictures, you can create data-connected Visio diagrams that display data, are easy to refresh, and dramatically increase your productivity.
Together these heads enable high accuracy performance of non-contact vision plus non-contact 3D measurement of high aspect-ratio minute form (Z = Sub µm ~ 100µm) functions in a single machine – eliminating the need to move a workpiece from one type of machine to another.
As a result, the Quick Vision® WLI offers a significant throughput improvement for non-contact measurement of items combining both 2D and minute form 3D features in a single workpiece – example subjects could include IC chips and packages, hybrid chassis, lead frames, and many types of precision machined and molded parts.